Skip to main content

Advanced Materials Nanocharacterization

Filippo Giannazzo, Pierre Eyben, Jacek Baranowski, Jean Camassel and Stefan Lanyi

  1. Nano Express

    Scaling properties of ballistic nano-transistors

    Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated I D - V D-traces separating the regimes of c...

    Ulrich Wulf, Marcus Krahlisch and Hans Richter

    Nanoscale Research Letters 2011 6:365

    Published on: 28 April 2011

  2. Nano Express

    Nanoscale structural characterization of epitaxial graphene grown on off-axis 4H-SiC (0001)

    In this work, we present a nanometer resolution structural characterization of epitaxial graphene (EG) layers grown on 4H-SiC (0001) 8° off-axis, by annealing in inert gas ambient (Ar) in a wide temperature ra...

    Carmelo Vecchio, Sushant Sonde, Corrado Bongiorno, Martin Rambach, Rositza Yakimova, Vito Raineri and Filippo Giannazzo

    Nanoscale Research Letters 2011 6:269

    Published on: 29 March 2011

  3. Nano Review

    Synthesis, structure, and opto-electronic properties of organic-based nanoscale heterojunctions

    Enormous research effort has been put into optimizing organic-based opto-electronic systems for efficient generation of free charge carriers. This optimization is mainly due to typically high dissociation ener...

    Bohuslav Rezek, Jan Čermák, Alexander Kromka, Martin Ledinský, Pavel Hubík, Jiří J Mareš, Adam Purkrt, Vĕra Cimrová, Antonín Fejfar and Jan Kočka

    Nanoscale Research Letters 2011 6:238

    Published on: 18 March 2011

  4. Nano Express

    Graphene on ferromagnetic surfaces and its functionalization with water and ammonia

    In this article, an angle-resolved photoelectron spectroscopy (ARPES), X-ray absorption spectroscopy (XAS), and density-functional theory (DFT) investigations of water and ammonia adsorption on graphene/Ni(111...

    Stefan Böttcher, Martin Weser, Yuriy S Dedkov, Karsten Horn, Elena N Voloshina and Beate Paulus

    Nanoscale Research Letters 2011 6:214

    Published on: 11 March 2011

  5. Nano Review

    Microscopic study of electrical properties of CrSi2 nanocrystals in silicon

    Semiconducting CrSi2 nanocrystallites (NCs) were grown by reactive deposition epitaxy of Cr onto n-type silicon and covered with a 50-nm epitaxial silicon cap. Two types of samples were investigated: in one of th...

    László Dózsa, Štefan Lányi, Vito Raineri, Filippo Giannazzo and Nikolay Gennadevich Galkin

    Nanoscale Research Letters 2011 6:209

    Published on: 9 March 2011

  6. Nano Express

    Micro-spectroscopy on silicon wafers and solar cells

    Micro-Raman (μRS) and micro-photoluminescence spectroscopy (μPLS) are demonstrated as valuable characterization techniques for fundamental research on silicon as well as for technological issues in the photovo...

    Paul Gundel, Martin C Schubert, Friedemann D Heinz, Robert Woehl, Jan Benick, Johannes A Giesecke, Dominik Suwito and Wilhelm Warta

    Nanoscale Research Letters 2011 6:197

    Published on: 4 March 2011

  7. Nano Express

    Chemical characterization of extra layers at the interfaces in MOCVD InGaP/GaAs junctions by electron beam methods

    Electron beam methods, such as cathodoluminescence (CL) that is based on an electron-probe microanalyser, and (200) dark field and high angle annular dark field (HAADF) in a scanning transmission electron micr...

    Cesare Frigeri, Alexey Aleksandrovich Shakhmin, Dmitry Anatolievich Vinokurov and Maria Vladimirovna Zamoryanskaya

    Nanoscale Research Letters 2011 6:194

    Published on: 3 March 2011

  8. Nano Express

    Multiscale investigation of graphene layers on 6H-SiC(000-1)

    In this article, a multiscale investigation of few graphene layers grown on 6H-SiC(000-1) under ultrahigh vacuum (UHV) conditions is presented. At 100-μm scale, the authors show that the UHV growth yields few ...

    Antoine Tiberj, Jean-Roch Huntzinger, Jean Camassel, Fanny Hiebel, Ather Mahmood, Pierre Mallet, Cecile Naud and Jean-Yves Veuillen

    Nanoscale Research Letters 2011 6:171

    Published on: 24 February 2011

  9. Nano Express

    Memory effects in annealed hybrid gold nanoparticles/block copolymer bilayers

    We report on the use of the self-organization process of sputtered gold nanoparticles on a self-assembled block copolymer film deposited by horizontal precipitation Langmuir-Blodgett (HP-LB) method. The morpho...

    Vanna Torrisi, Francesco Ruffino, Antonino Licciardello, Maria Grazia Grimaldi and Giovanni Marletta

    Nanoscale Research Letters 2011 6:167

    Published on: 23 February 2011

  10. Nano Review

    Nanoscale electro-structural characterisation of ohmic contacts formed on p-type implanted 4H-SiC

    This work reports a nanoscale electro-structural characterisation of Ti/Al ohmic contacts formed on p-type Al-implanted silicon carbide (4H-SiC). The morphological and the electrical properties of the Al-impla...

    Alessia Frazzetto, Filippo Giannazzo, Raffaella Lo Nigro, Salvatore Di Franco, Corrado Bongiorno, Mario Saggio, Edoardo Zanetti, Vito Raineri and Fabrizio Roccaforte

    Nanoscale Research Letters 2011 6:158

    Published on: 21 February 2011

  11. Nano Express

    Characterization of silicon heterojunctions for solar cells

    Conductive-probe atomic force microscopy (CP-AFM) measurements reveal the existence of a conductive channel at the interface between p-type hydrogenated amorphous silicon (a-Si:H) and n-type crystalline silicon (

    Jean-Paul Kleider, Jose Alvarez, Alexander Vitalievitch Ankudinov, Alexander Sergeevitch Gudovskikh, Ekaterina Vladimirovna Gushchina, Martin Labrune, Olga Alexandrovna Maslova, Wilfried Favre, Marie-Estelle Gueunier-Farret, Pere Roca i Cabarrocas and Eugene Ivanovitch Terukov

    Nanoscale Research Letters 2011 6:152

    Published on: 16 February 2011

  12. Nano Express

    Impact of AFM-induced nano-pits in a-Si:H films on silicon crystal growth

    Conductive tips in atomic force microscopy (AFM) can be used to localize field-enhanced metal-induced solid-phase crystallization (FE-MISPC) of amorphous silicon (a-Si:H) at room temperature down to nanoscale ...

    Elisseos Verveniotis, Bohuslav Rezek, Emil Šípek, Jiří Stuchlík, Martin Ledinský and Jan Kočka

    Nanoscale Research Letters 2011 6:145

    Published on: 15 February 2011

  13. Nano Review

    Scanning tip measurement for identification of point defects

    Self-assembled iron-silicide nanostructures were prepared by reactive deposition epitaxy of Fe onto silicon. Capacitance-voltage, current-voltage, and deep level transient spectroscopy (DLTS) were used to meas...

    László Dózsa, György Molnár, Vito Raineri, Filippo Giannazzo, János Ferencz and Štefan Lányi

    Nanoscale Research Letters 2011 6:140

    Published on: 14 February 2011

  14. Nano Review

    Near-surface processing on AlGaN/GaN heterostructures: a nanoscale electrical and structural characterization

    The effects of near-surface processing on the properties of AlGaN/GaN heterostructures were studied, combining conventional electrical characterization on high-electron mobility transistors (HEMTs), with advan...

    Giuseppe Greco, Filippo Giannazzo, Alessia Frazzetto, Vito Raineri and Fabrizio Roccaforte

    Nanoscale Research Letters 2011 6:132

    Published on: 11 February 2011

  15. Nano Express

    Nanoscale characterization of electrical transport at metal/3C-SiC interfaces

    In this work, the transport properties of metal/3C-SiC interfaces were monitored employing a nanoscale characterization approach in combination with conventional electrical measurements. In particular, using c...

    Jens Eriksson, Fabrizio Roccaforte, Sergey Reshanov, Stefano Leone, Filippo Giannazzo, Raffaella LoNigro, Patrick Fiorenza and Vito Raineri

    Nanoscale Research Letters 2011 6:120

    Published on: 7 February 2011

  16. Nano Express

    Scanning Probe Microscopy on heterogeneous CaCu3Ti4O12 thin films

    The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu3Ti4O12 (CCTO) thin films deposited by MOCVD on IrO2 bottom electrode. In particular, both techniq...

    Patrick Fiorenza, Raffaella Lo Nigro and Vito Raineri

    Nanoscale Research Letters 2011 6:118

    Published on: 4 February 2011

  17. Nano Express

    Atomic force microscopy investigation of the kinetic growth mechanisms of sputtered nanostructured Au film on mica: towards a nanoscale morphology control

    The study of surface morphology of Au deposited on mica is crucial for the fabrication of flat Au films for applications in biological, electronic, and optical devices. The understanding of the growth mechanis...

    Francesco Ruffino, Vanna Torrisi, Giovanni Marletta and Maria Grazia Grimaldi

    Nanoscale Research Letters 2011 6:112

    Published on: 31 January 2011

  18. Nano Express

    Conductive-probe atomic force microscopy characterization of silicon nanowire

    The electrical conduction properties of lateral and vertical silicon nanowires (SiNWs) were investigated using a conductive-probe atomic force microscopy (AFM). Horizontal SiNWs, which were synthesized by the ...

    José Alvarez, Irène Ngo, Marie-Estelle Gueunier-Farret, Jean-Paul Kleider, Linwei Yu, Pere Rocai Cabarrocas, Simon Perraud, Emmanuelle Rouvière, Caroline Celle, Céline Mouchet and Jean-Pierre Simonato

    Nanoscale Research Letters 2011 6:110

    Published on: 31 January 2011

  19. Nano Review

    Lateral homogeneity of the electronic properties in pristine and ion-irradiated graphene probed by scanning capacitance spectroscopy

    In this article, a scanning probe method based on nanoscale capacitance measurements was used to investigate the lateral homogeneity of the electron mean free path both in pristine and ion-irradiated graphene....

    Filippo Giannazzo, Sushant Sonde, Emanuele Rimini and Vito Raineri

    Nanoscale Research Letters 2011 6:109

    Published on: 31 January 2011

  20. Nano Express

    Doping graphene films via chemically mediated charge transfer

    Transparent conductive films (TCFs) are critical components of a myriad of technologies including flat panel displays, light-emitting diodes, and solar cells. Graphene-based TCFs have attracted a lot of attent...

    Ryousuke Ishikawa, Masashi Bando, Yoshitaka Morimoto and Adarsh Sandhu

    Nanoscale Research Letters 2011 6:111

    Published on: 31 January 2011

  21. Editorial

    Advanced materials nanocharacterization

    This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Ino...

    Filippo Giannazzo, Pierre Eyben, Jacek Baranowski, Jean Camassel and Stefan Lányi

    Nanoscale Research Letters 2011 6:107

    Published on: 31 January 2011