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Advanced Materials Nanocharacterization

Filippo Giannazzo, Pierre Eyben, Jacek Baranowski, Jean Camassel and Stefan Lanyi

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  1. Content type: Nano Express

    Micro-Raman and micro-transmission imaging experiments have been done on epitaxial graphene grown on the C- and Si-faces of on-axis 6H-SiC substrates. On the C-face it is shown that the SiC sublimation process...

    Authors: Antoine Tiberj, Nicolas Camara, Philippe Godignon and Jean Camassel

    Citation: Nanoscale Research Letters 2011 6:478

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  2. Content type: Nano Express

    Recently, we have suggested a scale-invariant model for a nano-transistor. In agreement with experiments a close-to-linear thresh-old trace was found in the calculated I D - V D-traces separating the regimes of c...

    Authors: Ulrich Wulf, Marcus Krahlisch and Hans Richter

    Citation: Nanoscale Research Letters 2011 6:365

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  3. Content type: Nano Express

    In this work, we present a nanometer resolution structural characterization of epitaxial graphene (EG) layers grown on 4H-SiC (0001) 8° off-axis, by annealing in inert gas ambient (Ar) in a wide temperature ra...

    Authors: Carmelo Vecchio, Sushant Sonde, Corrado Bongiorno, Martin Rambach, Rositza Yakimova, Vito Raineri and Filippo Giannazzo

    Citation: Nanoscale Research Letters 2011 6:269

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  4. Content type: Nano Review

    Enormous research effort has been put into optimizing organic-based opto-electronic systems for efficient generation of free charge carriers. This optimization is mainly due to typically high dissociation ener...

    Authors: Bohuslav Rezek, Jan Čermák, Alexander Kromka, Martin Ledinský, Pavel Hubík, Jiří J Mareš, Adam Purkrt, Vĕra Cimrová, Antonín Fejfar and Jan Kočka

    Citation: Nanoscale Research Letters 2011 6:238

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  5. Content type: Nano Express

    Understanding the roles of disorder and metal/graphene interface on the electronic and transport properties of graphene-based systems is crucial for a consistent analysis of the data deriving from experimental...

    Authors: Antonino La Magna and Ioannis Deretzis

    Citation: Nanoscale Research Letters 2011 6:234

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  6. Content type: Nano Express

    In this article, an angle-resolved photoelectron spectroscopy (ARPES), X-ray absorption spectroscopy (XAS), and density-functional theory (DFT) investigations of water and ammonia adsorption on graphene/Ni(111...

    Authors: Stefan Böttcher, Martin Weser, Yuriy S Dedkov, Karsten Horn, Elena N Voloshina and Beate Paulus

    Citation: Nanoscale Research Letters 2011 6:214

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  7. Content type: Nano Review

    Semiconducting CrSi2 nanocrystallites (NCs) were grown by reactive deposition epitaxy of Cr onto n-type silicon and covered with a 50-nm epitaxial silicon cap. Two types of samples were investigated: in one of th...

    Authors: László Dózsa, Štefan Lányi, Vito Raineri, Filippo Giannazzo and Nikolay Gennadevich Galkin

    Citation: Nanoscale Research Letters 2011 6:209

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  8. Content type: Nano Express

    Micro-Raman (μRS) and micro-photoluminescence spectroscopy (μPLS) are demonstrated as valuable characterization techniques for fundamental research on silicon as well as for technological issues in the photovo...

    Authors: Paul Gundel, Martin C Schubert, Friedemann D Heinz, Robert Woehl, Jan Benick, Johannes A Giesecke, Dominik Suwito and Wilhelm Warta

    Citation: Nanoscale Research Letters 2011 6:197

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  9. Content type: Nano Express

    Electron beam methods, such as cathodoluminescence (CL) that is based on an electron-probe microanalyser, and (200) dark field and high angle annular dark field (HAADF) in a scanning transmission electron micr...

    Authors: Cesare Frigeri, Alexey Aleksandrovich Shakhmin, Dmitry Anatolievich Vinokurov and Maria Vladimirovna Zamoryanskaya

    Citation: Nanoscale Research Letters 2011 6:194

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  10. Content type: Nano Express

    Here, we show that the Raman intensity of the G-mode in tip-enhanced Raman spectroscopy (TERS) is strongly dependent on the height of the bundle. Moreover, using TERS we are able to position different single-w...

    Authors: Niculina Peica, Christian Thomsen and Janina Maultzsch

    Citation: Nanoscale Research Letters 2011 6:174

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  11. Content type: Nano Express

    In this article, a multiscale investigation of few graphene layers grown on 6H-SiC(000-1) under ultrahigh vacuum (UHV) conditions is presented. At 100-μm scale, the authors show that the UHV growth yields few ...

    Authors: Antoine Tiberj, Jean-Roch Huntzinger, Jean Camassel, Fanny Hiebel, Ather Mahmood, Pierre Mallet, Cecile Naud and Jean-Yves Veuillen

    Citation: Nanoscale Research Letters 2011 6:171

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  12. Content type: Nano Express

    We report on the use of the self-organization process of sputtered gold nanoparticles on a self-assembled block copolymer film deposited by horizontal precipitation Langmuir-Blodgett (HP-LB) method. The morpho...

    Authors: Vanna Torrisi, Francesco Ruffino, Antonino Licciardello, Maria Grazia Grimaldi and Giovanni Marletta

    Citation: Nanoscale Research Letters 2011 6:167

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  13. Content type: Nano Express

    Silicon nanoclusters are of prime interest for new generation of optoelectronic and microelectronics components. Physical properties (light emission, carrier storage...) of systems using such nanoclusters are ...

    Authors: Manuel Roussel, Etienne Talbot, Fabrice Gourbilleau and Philippe Pareige

    Citation: Nanoscale Research Letters 2011 6:164

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  14. Content type: Nano Review

    This work reports a nanoscale electro-structural characterisation of Ti/Al ohmic contacts formed on p-type Al-implanted silicon carbide (4H-SiC). The morphological and the electrical properties of the Al-impla...

    Authors: Alessia Frazzetto, Filippo Giannazzo, Raffaella Lo Nigro, Salvatore Di Franco, Corrado Bongiorno, Mario Saggio, Edoardo Zanetti, Vito Raineri and Fabrizio Roccaforte

    Citation: Nanoscale Research Letters 2011 6:158

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  15. Content type: Nano Express

    Conductive-probe atomic force microscopy (CP-AFM) measurements reveal the existence of a conductive channel at the interface between p-type hydrogenated amorphous silicon (a-Si:H) and n-type crystalline silicon (

    Authors: Jean-Paul Kleider, Jose Alvarez, Alexander Vitalievitch Ankudinov, Alexander Sergeevitch Gudovskikh, Ekaterina Vladimirovna Gushchina, Martin Labrune, Olga Alexandrovna Maslova, Wilfried Favre, Marie-Estelle Gueunier-Farret, Pere Roca i Cabarrocas and Eugene Ivanovitch Terukov

    Citation: Nanoscale Research Letters 2011 6:152

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  16. Content type: Nano Express

    Conductive tips in atomic force microscopy (AFM) can be used to localize field-enhanced metal-induced solid-phase crystallization (FE-MISPC) of amorphous silicon (a-Si:H) at room temperature down to nanoscale ...

    Authors: Elisseos Verveniotis, Bohuslav Rezek, Emil Šípek, Jiří Stuchlík, Martin Ledinský and Jan Kočka

    Citation: Nanoscale Research Letters 2011 6:145

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  17. Content type: Nano Express

    We apply atomic force microscope for local electrostatic charging of oxygen-terminated nanocrystalline diamond (NCD) thin films deposited on silicon, to induce electrostatically driven self-assembly of colloid...

    Authors: Elisseos Verveniotis, Alexander Kromka, Martin Ledinský, Jan Čermák and Bohuslav Rezek

    Citation: Nanoscale Research Letters 2011 6:144

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  18. Content type: Nano Review

    Self-assembled iron-silicide nanostructures were prepared by reactive deposition epitaxy of Fe onto silicon. Capacitance-voltage, current-voltage, and deep level transient spectroscopy (DLTS) were used to meas...

    Authors: László Dózsa, György Molnár, Vito Raineri, Filippo Giannazzo, János Ferencz and Štefan Lányi

    Citation: Nanoscale Research Letters 2011 6:140

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  19. Content type: Nano Review

    The effects of near-surface processing on the properties of AlGaN/GaN heterostructures were studied, combining conventional electrical characterization on high-electron mobility transistors (HEMTs), with advan...

    Authors: Giuseppe Greco, Filippo Giannazzo, Alessia Frazzetto, Vito Raineri and Fabrizio Roccaforte

    Citation: Nanoscale Research Letters 2011 6:132

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  20. Content type: Nano Express

    In this work, the transport properties of metal/3C-SiC interfaces were monitored employing a nanoscale characterization approach in combination with conventional electrical measurements. In particular, using c...

    Authors: Jens Eriksson, Fabrizio Roccaforte, Sergey Reshanov, Stefano Leone, Filippo Giannazzo, Raffaella LoNigro, Patrick Fiorenza and Vito Raineri

    Citation: Nanoscale Research Letters 2011 6:120

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  21. Content type: Nano Express

    The conductive atomic force microscopy provided a local characterization of the dielectric heterogeneities in CaCu3Ti4O12 (CCTO) thin films deposited by MOCVD on IrO2 bottom electrode. In particular, both techniq...

    Authors: Patrick Fiorenza, Raffaella Lo Nigro and Vito Raineri

    Citation: Nanoscale Research Letters 2011 6:118

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  22. Content type: Nano Review

    In this article, a scanning probe method based on nanoscale capacitance measurements was used to investigate the lateral homogeneity of the electron mean free path both in pristine and ion-irradiated graphene....

    Authors: Filippo Giannazzo, Sushant Sonde, Emanuele Rimini and Vito Raineri

    Citation: Nanoscale Research Letters 2011 6:109

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  23. Content type: Nano Express

    Transparent conductive films (TCFs) are critical components of a myriad of technologies including flat panel displays, light-emitting diodes, and solar cells. Graphene-based TCFs have attracted a lot of attent...

    Authors: Ryousuke Ishikawa, Masashi Bando, Yoshitaka Morimoto and Adarsh Sandhu

    Citation: Nanoscale Research Letters 2011 6:111

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  24. Content type: Editorial

    This special issue of Nanoscale Research Letters contains scientific contributions presented at the Symposium D "Multidimensional Electrical and Chemical Characterization at the Nanometer-scale of Organic and Ino...

    Authors: Filippo Giannazzo, Pierre Eyben, Jacek Baranowski, Jean Camassel and Stefan Lányi

    Citation: Nanoscale Research Letters 2011 6:107

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