Advanced characterization methods for nano-materials
Guest edited by Bae Ho Park (Konkuk University), Young Jun Chang (University of Seoul) and Taekjib Choi (Sejong University)
Nanoscience has developed rapidly in the past decades with the help of various nanoscale tools, such as scanning microscopy, electron microscopy, and theoretical simulation. Since discovery of novel nano-materials and its development strongly depends on the new nanoscale technologies, newly emerging nano technologies are essential for leading nano science and the realization of nano electronics. This thematic series introduces and reviews recent advances in the emerging nanoscale methodologies for characterizing structural, chemical, electronic, and magnetic properties.