This work aims at detecting surface defects on reflecting industrial parts. A machine vision system, performing the detection of geometric aspect surface defects, is completely described. The revealing of defe...
Accurate detection and classification of wafer defects constitute an important component of the IC production process because together they can immediately improve the yield and also provide information needed...
This study concerns the detection and localization of weed patches in order to improve the knowledge on weed-crop competition. A remote control aircraft provided with a camera allowed to obtain low cost and re...
We present an algorithm for fish otolith growth ring detection using a multiagent system. Up to now, the identification of growth rings, for age estimation, is routinely achieved by human readers, but this tas...
We present one method for detecting defects on an inclined textured plane. This method uses a combination of a shape from texture (SFT) method with the Delaunay triangulation technique. The SFT method provides...
This paper presents a surface inspection prototype of an automatic system for precision ground metallic surfaces, in this case bearing rolls. The surface reflectance properties are modeled and verified with op...
Quality control in mammography is based upon subjective interpretation of the image quality of a test phantom. In order to suppress subjectivity due to the human observer, automated computer analysis of the Le...
A common objective in the web transport industry is to increase the velocity as much as possible. Some disturbances drastically limit this velocity. Time-varying eccentricity of the rolling winder is one of th...
This paper describes the implementation of INFIBRA, a machine vision system used in the quality control of acrylic fibre production. The system was developed by INETI under a contract with a leading industrial...
Image data management in the semiconductor manufacturing environment is becoming more problematic as the size of silicon wafers continues to increase, while the dimension of critical features continues to shri...