Imaging and Modeling in Electron Microscopy - Recent Advances
Edited by: Nigel D. Browning
This series in Advanced Structural and Chemical Imaging features articles from presentations made at the “Imaging and Modeling in Electron Microscopy - Recent Advances” workshop organized at the Banff International Research Station for Mathematical Innovation and Discovery from May 18-23, 2014. The aim of the workshop was to connect mathematicians together with specialists in imaging, material science, and electron microscopy to advance modeling, simulation and analysis by incorporating state-of-the-art mathematical and computational tools and methods in electron microscopy. The papers in this themed issue represent the foundations for this interdisciplinary field that resulted from the exchange ideas and the sharing of data at the meeting and the first steps in the development of new imaging and sensing paradigms.